Raik, Sergei V.: search on Z-Library

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1

Fast identification of true critical paths in sequential circuits

Ubar, Raimund, Kostin, Sergei, Jenihhin, Maksim, Raik, Jaan, Jürimägi, Lembit

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 1021 KB

english, 2018

2

Accessibility of chitin and chitosan in enzymatic hydrolysis: A review

Poshina, Daria N., Raik, Sergei V., Poshin, Alexander N., Skorik, Yury A.

Journal:

Polymer Degradation and Stability

Year:

2018

Language:

english

File:

PDF, 625 KB

english, 2018

3

[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Application Specific True Critical Paths Identification in Sequential Circuits

Jurimagi, Lembit, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan, Devadze, Sergei, Oyeniran, Adeboye Stephen

Year:

2019

File:

PDF, 302 KB

2019

4

[IEEE 2009 EAEEIE Annual Conference - Valencia, Spain (2009.06.22-2009.06.24)] 2009 EAEEIE Annual Conference - Teaching research in the laboratory using diagnosis environment for digital systems

Kostin, Sergei, Ubar, Raimund, Raik, Jaan, Aarna, Margit, Brik, Marina, Wuttke, H.-D.

Year:

2009

Language:

english

File:

PDF, 321 KB

english, 2009

5

SSBDDs and Double Topology for Multiple Fault Reasoning

Raimund Ubar,Sergei Kostin,Jaan Raik

Journal:

Радиоэлектроника и информатика

Year:

2013

Language:

english

File:

PDF, 202 KB

english, 2013

6

Embedded fault diagnosis in digital systems with BIST

Raimund Ubar, Sergei Kostin, Jaan Raik

Journal:

Microprocessors and Microsystems

Year:

2008

Language:

english

File:

PDF, 476 KB

english, 2008

7

[IEEE 2008 Asia and South Pacific Design Automation Conference (ASPDAC) - Seoul, South Korea (2008.03.21-2008.03.24)] 2008 Asia and South Pacific Design Automation Conference - Parallel fault backtracing for calculation of fault coverage

Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Year:

2008

Language:

english

File:

PDF, 134 KB

english, 2008

8

[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - Hierarchical identification of NBTI-critical gates in nanoscale logic

Kostin, Sergei, Raik, Jaan, Ubar, Raimund, Jenihhin, Maksim, Vargas, Fabian, Poehls, Leticia Maria Bolzani, Copetti, Thiago Santos

Year:

2014

Language:

english

File:

PDF, 766 KB

english, 2014

9

[IFIP Advances in Information and Communication Technology] VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability Volume 508 || Beyond Ideal DVFS Through Ultra-Fine Grain Vdd-Hopping

Hollstein, Thomas, Raik, Jaan, Kostin, Sergei, Tšertov, Anton, O'Connor, Ian, Reis, Ricardo

Year:

2017

Language:

english

File:

PDF, 2.55 MB

english, 2017

10

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Defect-oriented module-level fault diagnosis in digital circuits

Kostin, Sergei, Ubar, Raimund, Raik, Jaan

Year:

2011

Language:

english

File:

PDF, 719 KB

english, 2011

11

[IEEE 2010 12th Biennial Baltic Electronics Conference (BEC2010) - Tallinn, Estonia (2010.10.4-2010.10.6)] 2010 12th Biennial Baltic Electronics Conference - Macro level defect-oriented diagnosability of digital circuits

Kostin, Sergei, Ubar, Raimund, Raik, Jaan

Year:

2010

Language:

english

File:

PDF, 102 KB

english, 2010

12

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance

Ubar, Raimund, Devadze, Sergei, Jenihhin, Maksim, Raik, Jaan, Jervan, Gert, Ellervee, Peeter

Year:

2008

Language:

english

File:

PDF, 488 KB

english, 2008

13

[IEEE 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Dresden, Germany (2017.4.19-2017.4.21)] 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - A scalable technique to identify true critical paths in sequential circuits

Ubar, Raimund, Kostin, Sergei, Jenihhin, Maksim, Raik, Jaan

Year:

2017

Language:

english

File:

PDF, 446 KB

english, 2017

14

Functional self-test of high-performance pipe-lined signal processing architectures

Gorev, Maksim, Ubar, Raimund, Ellervee, Peeter, Devadze, Sergei, Raik, Jaan, Min, Mart

Journal:

Microprocessors and Microsystems

Year:

2014

Language:

english

File:

PDF, 2.04 MB

english, 2014

15

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Parallel X-fault simulation with critical path tracing technique

Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Year:

2010

Language:

english

File:

PDF, 250 KB

english, 2010

16

Polysaccharides in Ocular Drug Delivery

Dubashynskaya, Natallia, Poshina, Daria, Raik, Sergei, Urtti, Arto, Skorik, Yury A.

Journal:

Year:

2019

File:

PDF, 1.07 MB

2019

17

[IEEE 2013 NORCHIP - Vilnius, Lithuania (2013.11.11-2013.11.12)] 2013 NORCHIP - At-speed self-testing of high-performance pipe-lined processing architectures

Gorev, Maksim, Ubar, Raimund, Ellervee, Peeter, Devadze, Sergei, Raik, Jaan, Min, Mart

Year:

2013

Language:

english

File:

PDF, 505 KB

english, 2013

18

[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - Investigations of the diagnosibility of digital networks with BIST

Ubar, Raimund, Kostin, Sergei, Raik, Jaan

Year:

2009

Language:

english

File:

PDF, 124 KB

english, 2009

19

[IEEE 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD) - Lille, France (2010.09.1-2010.09.3)] 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools - Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level Simulation of Digital Circuits

Mironov, Dmitri, Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Year:

2010

Language:

english

File:

PDF, 573 KB

english, 2010

20

[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Application Specific True Critical Paths Identification in Sequential Circuits

Jurimagi, Lembit, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan, Devadze, Sergei, Oyeniran, Adeboye Stephen

Year:

2019

File:

PDF, 302 KB

2019

21

[IEEE 2016 15th Biennial Baltic Electronics Conference (BEC) - Tallinn, Estonia (2016.10.3-2016.10.5)] 2016 15th Biennial Baltic Electronics Conference (BEC) - A tool for random test generation targeting high diagnostic resolution

Osimiry, Emmanuel Ovie, Kostin, Sergei, Raik, Jaan, Ubar, Raimund

Year:

2016

Language:

english

File:

PDF, 309 KB

english, 2016

22

[IEEE 2009 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools (DSD) - Patras, Greece (2009.08.27-2009.08.29)] 2009 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools - Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems

Ubar, Raimund, Kostin, Sergei, Raik, Jaan

Year:

2009

Language:

english

File:

PDF, 919 KB

english, 2009

23

[IEEE Technology of Integrated Systems in Nanoscal Era (DTIS) - Cairo, Egypt (2009.04.6-2009.04.9)] 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era - Parallel exact critical path tracing fault simulation with reduced memory requirements

Devadze, Sergei, Ubar, Raimund, Raik, Jaan, Jutman, Artur

Year:

2009

Language:

english

File:

PDF, 350 KB

english, 2009

24

[IEEE 2012 15th Euromicro Conference on Digital System Design (DSD) - Cesme, Izmir, Turkey (2012.09.5-2012.09.8)] 2012 15th Euromicro Conference on Digital System Design - How to Prove that a Circuit is Fault-Free?

Ubar, Raimund, Kostin, Sergei, Raik, Jaan

Year:

2012

Language:

english

File:

PDF, 425 KB

english, 2012

25

[IFIP Advances in Information and Communication Technology] VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability Volume 508 || Approximate Matrix Inversion for Linear Pre-coders in Massive MIMO

Hollstein, Thomas, Raik, Jaan, Kostin, Sergei, Tšertov, Anton, O'Connor, Ian, Reis, Ricardo

Year:

2017

Language:

english

File:

PDF, 885 KB

english, 2017

26

N -[4-( N,N,N -trimethylammonium)benzyl]chitosan chloride: Synthesis, interaction with DNA and evaluation of transfection efficiency

Raik, Sergei V., Poshina, Daria N., Lyalina, Tatiana A., Polyakov, Dmitry S., Vasilyev, Vadim B., Kritchenkov, Andreii S., Skorik, Yury A.

Journal:

Carbohydrate Polymers

Year:

2017

Language:

english

File:

PDF, 1.04 MB

english, 2017

27

[IEEE 2016 17th Latin-American Test Symposium (LATS) - Foz do Iguacu, Brazil (2016.4.6-2016.4.8)] 2016 17th Latin-American Test Symposium (LATS) - Gate-level modelling of NBTI-induced delays under process variations

Copetti, Thiago, Medeiros, Guilherme, Poehls, Leticia Bolzani, Vargas, Fabian, Kostin, Sergei, Jenihhin, Maksim, Raik, Jaan, Ubar, Raimund

Year:

2016

Language:

english

File:

PDF, 2.22 MB

english, 2016

28

[IEEE 2009 1st Asia Symposium on Quality Electronic Design (ASQED 2009) - Kuala Lumpur, Malaysia (2009.07.15-2009.07.16)] 2009 1st Asia Symposium on Quality Electronic Design - Combined fault-model free cause-effect and effect-cause fault diagnosis in block-level digital networks

Ubar, Raimund, Kostin, Sergei, Raik, Jaan

Year:

2009

Language:

english

File:

PDF, 216 KB

english, 2009

29

Synthesis of N -succinyl- and N -glutaryl-chitosan derivatives and their antioxidant, antiplatelet, and anticoagulant activity

Skorik, Yury A., Kritchenkov, Andreii S., Moskalenko, Yulia E., Golyshev, Anton A., Raik, Sergei V., Whaley, Andrei K., Vasina, Lyubov V., Sonin, Dmitry L.

Journal:

Carbohydrate Polymers

Year:

2017

Language:

english

File:

PDF, 1.90 MB

english, 2017

30

Comparative Study of Diethylaminoethyl-Chitosan and Methylglycol-Chitosan as Potential Non-Viral Vectors for Gene Therapy

Raik, Sergei, Andranovitš, Stanislav, Petrova, Valentina, Xu, Yingying, Lam, Jenny, Morris, Gordon, Brodskaia, Alexandra, Casettari, Luca, Kritchenkov, Andreii, Skorik, Yury

Journal:

Year:

2018

Language:

english

File:

PDF, 3.44 MB

english, 2018

31

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs

Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Year:

2007

Language:

english

File:

PDF, 227 KB

english, 2007

32

[IEEE 2014 17th Euromicro Conference on Digital System Design (DSD) - Verona, Italy (2014.8.27-2014.8.29)] 2014 17th Euromicro Conference on Digital System Design - Critical Path Tracing Based Simulation of Transition Delay Faults

Kousaar, Jaak, Ubar, Raimund, Devadze, Sergei, Raik, Jaan

Year:

2014

Language:

english

File:

PDF, 271 KB

english, 2014

33

[IEEE 2011 IEEE International Conference on Computer Science and Automation Engineering (CSAE) - Shanghai, China (2011.06.10-2011.06.12)] 2011 IEEE International Conference on Computer Science and Automation Engineering - Digital logic simulation with compressed BDDs

Ubar, Raimund, Mironov, Dmitri, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Year:

2011

Language:

english

File:

PDF, 114 KB

english, 2011

34

[IEEE 2012 13th Biennial Baltic Electronics Conference (BEC2012) - Tallinn, Estonia (2012.10.3-2012.10.5)] 2012 13th Biennial Baltic Electronics Conference - Multiple fault diagnosis with BDD based boolean differential equations

Ubar, Raimund, Raik, Jaan, Kostin, Sergei, Kousaar, Jaak

Year:

2012

Language:

english

File:

PDF, 118 KB

english, 2012

35

Polysaccharides in Ocular Drug Delivery

Dubashynskaya, Natallia, Poshina, Daria, Raik, Sergei, Urtti, Arto, Skorik, Yury A.

Journal:

Year:

2019

Language:

english

File:

PDF, 1.07 MB

english, 2019

36

[IEEE 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Ho Chi Minh City, Vietnam (2010.01.13-2010.01.15)] 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits

Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Year:

2010

Language:

english

File:

PDF, 344 KB

english, 2010

37

[IEEE 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) - Gdynia, Poland (2018.6.21-2018.6.23)] 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) - Parallel Critical Path Tracing Fault Simulation in Sequential Circuits

Kousaar, Jaak, Ubar, Raimund, Kostin, Sergei, Devadze, Sergei, Raik, Jaan

Year:

2018

File:

PDF, 530 KB

2018

38

[IEEE 2009 IEEE International Conference on Microelectronic Systems Education (MSE) - San Francisco, CA, USA (2009.07.25-2009.07.27)] 2009 IEEE International Conference on Microelectronic Systems Education - Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems

Ubar, Raimund, Jutman, Artur, Raik, Jaan, Kostin, Sergei, Wuttke, H.-D.

Year:

2009

Language:

english

File:

PDF, 547 KB

english, 2009

39

[IEEE 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Belgrade, Serbia (2015.4.22-2015.4.24)] 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic

Kostin, Sergei, Raik, Jaan, Ubar, Raimund, Jenihhin, Maksim, Copetti, Thiago, Vargas, Fabian, Poehls, Leticia Bolzani

Year:

2015

Language:

english

File:

PDF, 298 KB

english, 2015

40

Nonspecific enzymatic hydrolysis of a highly ordered chitopolysaccharide substrate

Poshina, Daria N., Raik, Sergei V., Sukhova, Arina A., Tyshkunova, Irina V., Romanov, Dmitry P., Eneyskaya, Elena V., Kulminskaya, Anna A., Skorik, Yury A.

Journal:

Carbohydrate Research

Year:

2020

File:

PDF, 748 KB

2020

41

Mucoadhesive cholesterol-chitosan self-assembled particles for topical ocular delivery of dexamethasone

Dubashynskaya, Natallia V., Golovkin, Alexey S., Kudryavtsev, Igor V., Prikhodko, Stanislava S., Trulioff, Andrey S., Bokatyi, Anton N., Poshina, Daria N., Raik, Sergei V., Skorik, Yury A.

Journal:

International Journal of Biological Macromolecules

Year:

2020

File:

PDF, 1.09 MB

2020

42

[IEEE 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Lubeck, Germany (2007.08.29-2007.08.31)] 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Fault Diagnosis in Integrated Circuits with BIST

Ubar, Raimund, Kostin, Sergei, Raik, Jaan, Evartson, Teet, Lensen, Harri

Year:

2007

Language:

english

File:

PDF, 233 KB

english, 2007

43

Effect of Double Substitution in Cationic Chitosan Derivatives on DNA Transfection Efficiency

Badazhkova, Veronika D., Raik, Sergei V., Polyakov, Dmitry S., Poshina, Daria N., Skorik, Yury A.

Journal:

Year:

2020

File:

PDF, 2.82 MB

2020

44

[IEEE 2012 13th Latin American Test Workshop - LATW - Quito, Ecuador (2012.04.10-2012.04.13)] 2012 13th Latin American Test Workshop (LATW) - About robustness of test patterns regarding multiple faults

Ubar, Raimund, Kostin, Sergei, Raik, Jaan

Year:

2012

Language:

english

File:

PDF, 1.13 MB

english, 2012

45

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra

Kõusaar, Jaak, Ubar, Raimund, Devadze, Sergei, Raik, Jaan

Journal:

Microprocessors and Microsystems

Year:

2015

Language:

english

File:

PDF, 1.09 MB

english, 2015

46

[IFIP Advances in Information and Communication Technology] VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability Volume 508 || Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors

Hollstein, Thomas, Raik, Jaan, Kostin, Sergei, Tšertov, Anton, O'Connor, Ian, Reis, Ricardo

Year:

2017

Language:

english

File:

PDF, 1.32 MB

english, 2017

47

[IEEE 2013 Euromicro Conference on Digital System Design (DSD) - Los Alamitos, CA, USA (2013.09.4-2013.09.6)] 2013 Euromicro Conference on Digital System Design - Identifying NBTI-Critical Paths in Nanoscale Logic

Ubar, Raimund, Vargas, Fabian, Jenihhin, Maksim, Raik, Jaan, Kostin, Sergei, Poehls, Leticia Bolzani

Year:

2013

Language:

english

File:

PDF, 511 KB

english, 2013

48

[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Multiple stuck-at-fault detection theorem

Ubar, Raimund, Kostin, Sergei, Raik, Jaan

Year:

2012

Language:

english

File:

PDF, 721 KB

english, 2012

49

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits

Jenihhin, Maksim, Squillero, Giovanni, Copetti, Thiago Santos, Tihhomirov, Valentin, Kostin, Sergei, Gaudesi, Marco, Vargas, Fabian, Raik, Jaan, Sonza Reorda, Matteo, Bolzani Poehls, Leticia, Ubar, Ra

Journal:

Journal of Electronic Testing

Year:

2016

Language:

english

File:

PDF, 1.77 MB

english, 2016

50

[IEEE 2016 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC) - Copenhagen, Denmark (2016.11.1-2016.11.2)] 2016 IEEE Nordic Circuits and Systems Conference (NORCAS) - A novel random approach to diagnostic test generation

Osimiry, Emmanuel Ovie, Ubar, Raimund, Kostin, Sergei, Raik, Jaan

Year:

2016

Language:

english

File:

PDF, 362 KB

english, 2016

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— Carlos María Domínguez

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